FPGA 时延故障检测技术研究磁

摘要

With the fast application of FPGA devices ,the FPGA device fault testing and fault diagnosis method for a more comprehensive study is of great significance .The delay‐fault is an important type of FPGA interior faults .The FPGA delay‐fault includes interior logic resources delay and interior routing resources delay .Therefore ,the inter structure and de‐lay‐fault of FPGA are analyzed ,and the fault testing method for interior logic resources delay and interior routing resources delay are researched .The test approach is successfully implemented using one Virtex‐ Ⅱ FPGA of Xilinx .The realization of Delay‐Fault Testing technology in FPGAs is proved .%随着 FPGA 器件的应用越来越广泛，FPGA 的测试和故障诊断技术得到了广泛重视和研究。 FPGA 的时延故障是 FPGA 内部故障中非常重要的一类故障类型，主要包含器件内部逻辑资源时延故障和连线资源时延故障。论文通过分析 FPGA 的内部结构和时延故障特性，研究 FPGA 内部逻辑资源时延和连线资源时延故障检测方法。利用 Xilinx 公司Virtex‐Ⅱ系列 FPGA 完成时延故障检测方法验证，证明了 FPGA 时延故障检测的可实现性。