边界扫描测试技术在存储器测试中的应用

摘要

Boundary scan test technology is one testing technology based on integrate circuit (IC) measurability design.Electrocircuit system can be tested and diagnosed by analyzing the output signal of the circuit inter testing register.The test-port of functional, inter-connect and interactional effect are provided by boundary scan test technology, so it is convenient to test complex IC.The structure, test-flow, test-port and data/instruction register prescribed by IEEE 1149.1 of the boundary scan test are personated.In the end, one testing project of Xilinx programmable memory, XCF series, based Boundary Scan Test is contrived.%边界扫描测试技术是一种基于集成电路可测性设计的测试技术,通过对集成电路内部测试寄存器输出响应的分析完成电路系统的测试及故障诊断.它提供了对器件的功能、互连及相互间影响进行测试的接口, 极大地方便了对于复杂电路的测试.文章介绍了边界扫描的基本结构、边界扫描测试操作流程、测试接口和IEEE 1149.1标准规定的数据寄存器和指令寄存器,结合Xilinx公司可编程器件用配置存储器XCF系列芯片的进行基于边界扫描测试技术的测试方案设计.