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Water Dissociation Phenomena on a Bipolar Membrane——Current-voltage Curve in Relation with Ionic Transport and Limiting Current Density

机译:双极膜上的水离解现象-电流-电压曲线与离子迁移和极限电流密度的关系

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The water dissociation mechanism on a bipolar membrane under the electrical field was investigated and characterized in terms of ionic transport and limiting current density. It is considered that the depletion layer exists at the junction of a bipolar membrane, which is coincided with the viewpoint of the most literatures, but we also consider that the thickness and conductivity of this layer is not only related with the increase of the applied voltage but also with the limiting current density. Below the limiting current density, the thickness of the depletion layer keeps a constant and the conductivity decreases with the increase of the applied voltage;while above the limiting current density, the depletion thickness will increase with the increase of the applied voltage and the conductivity keeps a very low constant. Based on the data reported in the literatures and independent determinations, the limiting current density was calculated and the experimental curves Ⅰ- Ⅴ in the two directions were compared with the theoretical calculations. It is demonstrated that above the limiting current density, the experimental results,either in the L-H direction or in the H-L direction, are consistent with the theoretical calculations; below the limiting current density, a slight deviation exists between the experimental and the theoretical results, and between the experimental results in the two directions. The change in Donnan potential due to the asymmetry of the mono-layers and the changes of ionic composition in the two directions is possibly responsible for this deviation.
机译:研究了电场作用下双极膜上的水离解机理,并根据离子迁移和极限电流密度进行了表征。认为耗尽层存在于双极膜的接合处,这与大多数文献的观点是一致的,但是我们还认为该层的厚度和电导率不仅与施加电压的增加有关而且还有极限电流密度。低于极限电流密度,耗尽层的厚度保持恒定,并且电导率随施加电压的增加而减小;而超过极限电流密度,耗尽层厚度将随着施加电压的增加而增大,并且电导率保持不变。一个非常低的常数。根据文献报道的数据和独立测定的结果,计算极限电流密度,并将两个方向上的实验曲线Ⅰ-Ⅴ与理论计算值进行比较。结果表明,在极限电流密度以上,L-H方向或H-L方向的实验结果与理论计算吻合。在极限电流密度以下,实验和理论结果之间以及在两个方向上的实验结果之间存在微小的偏差。由于单层不对称而导致的Donnan电势变化以及两个方向上离子组成的变化可能是造成这种偏差的原因。

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