Monolayer graphene exfoliated on SiO2/Si substrate and bulk HOPG were irradiated by swift heavy ions (SHIs,479 MeV 86Kr and 112Sn) and highly charged ions (HCIs, 4 MeV 86Kr19+). The different irradiation effects caused by these two kinds of different ions were investigated by Raman spectrometer. The similarities and differences between HCIs and SHIs impacted graphene and HOPG are presented.
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