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High-resolution transmission electron microscopy analysis of nanostructures

机译：纳米结构的高分辨率透射电子显微镜分析

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作者
Curtis, Mark Erman.;
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作者单位

The University of Oklahoma.;

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授予单位 The University of Oklahoma.;
学科
学位 Ph.D.
年度 2009
页码 122 p.
总页数 122
原文格式 PDF
正文语种 eng
中图分类 AAI3396478;
关键词
Nanostructures; Transmission electron microscopy;

机译：纳米结构;透射电子显微镜;

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6. Study of the Microstructure of Amorphous Silica Nanostructures Using High-Resolution Electron Microscopy Electron Energy Loss Spectroscopy X-ray Powder Diffraction and Electron Pair Distribution Function [O] . Lahcen Khouchaf, Khalid Boulahya, Partha Pratim Das, 2020

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7. Electron diffraction and high-resolution transmission microscopy studies of nanostructured Si thin films deposited by radiofrequency dusty plasmas [O] . Viera, Gregorio, Huet, Stéphanie, Mikikian, Maxime, 2002

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8. Structural Characterization and Gas Reactions of Small Metal Particles by High-Resolution TEM (Transmission Electron Microscopy) and TED (Transmission Electron Diffraction). Semiannual Technical Report January 1, 1985-June 30, 198 [R] . Heinemann, K. 1985

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High-resolution transmission electron microscopy analysis of nanostructures

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