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Intrinsic and extrinsic effects on Young's modulus of nanowire measured in nanobridge tests

机译：在纳米桥测试中测量的对纳米线的杨氏模量的内在和外在影响

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作者
Chan, Wing Kin;
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作者单位

Hong Kong University of Science and Technology (Hong Kong);

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授予单位 Hong Kong University of Science and Technology (Hong Kong);
学科
学位 Ph.D.
年度 2009
页码 144 p.
总页数 144
原文格式 PDF
正文语种 eng
中图分类
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Intrinsic and extrinsic effects on Young's modulus of nanowire measured in nanobridge tests

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