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EMI failure analysis techniques and noise prediction for trace crossing split planes.

机译:EMI故障分析技术和轨迹交叉分裂平面的噪声预测。

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摘要

A variety of methods exist that help locate the source, coupling path, and antenna in an electromagnetic interference (EMI) problem. No single method is the best option in all cases. A good electromagnetic compatibility (EMC) engineer should understand and have experience with a wide range of failure analysis methods and thus, be able to select the most appropriate ones for a given problem. The first three papers are from a series of articles, which explains a set of methods for the analysis of EMI failures. Each method is categorized based on two criteria: (1) the elements in an EMI problem each method tries to determine: the source, coupling path or the antenna; (2) the complexity of each method. The methods are explained to guide EMC engineers in selecting the right one by evaluating the advantages and limitations of each method.;Printed circuit boards (PCBs) often have high speed data traces crossing splits in the adjacent reference planes due to space limitations and cost constraints. These split planes usually result from different power islands on nearby layers. The fourth paper quantifies the effects of the split planes and the associated stitching capacitors for various stack-up configurations.
机译:存在多种方法来帮助定位电磁干扰(EMI)问题中的源,耦合路径和天线。在所有情况下,没有一种方法是最佳选择。优秀的电磁兼容性(EMC)工程师应了解并具有各种故障分析方法的经验,因此能够为给定的问题选择最合适的方法。前三篇论文来自一系列文章,其中介绍了用于分析EMI故障的一组方法。每种方法都基于两个标准进行分类:(1)每种方法都试图确定EMI问题中的元素:源,耦合路径或天线; (2)每种方法的复杂性。解释了这些方法,以指导EMC工程师通过评估每种方法的优点和局限性来选择合适的方法。由于空间限制和成本限制,印刷电路板(PCB)通常具有高速数据迹线,该数据迹线跨越相邻参考平面中的裂缝。这些分裂的飞机通常是由附近各层的不同动力岛造成的。第四篇论文量化了分离平面和相关缝合电容器对于各种堆叠配置的影响。

著录项

  • 作者

    Pan, Weifeng.;

  • 作者单位

    Missouri University of Science and Technology.;

  • 授予单位 Missouri University of Science and Technology.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2009
  • 页码 57 p.
  • 总页数 57
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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