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Angular spectrum-based statistical formulation of ultrasound scattering by rough surfaces.

机译:基于角光谱的粗糙表面超声散射的统计公式。

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摘要

The determination of the field which is scattered from a rough interface is an area of considerable interest in both ultrasonics and optics. The effects of surface roughness can be dominant in the total scattered field and thus it is important to quantify these effects for the deterministically or statistically described surface. Applications of the scattering from rough surfaces include nondestructive evaluation of surface quality, characterization of surface irregularities such as cracks and flaws, and sample differentiation based on surface properties.;It has been the goal of this research to develop an accurate modeling tool for predicting the scattered field from a deterministic or stochastic surface. A classical approach for determining scattering effects is Kirchhoff theory. An alternative approach, using the angular spectrum representation of field quantities, is compared with classical Kirchhoff theory for accuracy, validity, and computational efficiency considerations. The Kirchhoff and angular spectrum representations of the field scattered from a deterministic irregular surface form the foundation for this research. Simulations using both of these representations of the field scattered from deterministic surfaces of one- and two-dimensional roughness were completed to evaluate the effects of surface descriptors including the correlation function, correlation length, surface height distribution, and the RMS surface height. Both Kirchhoff and angular spectrum theories have been extended to predict the magnitude of the field which is scattered from a one- or two-dimensional stochastic surface. These statistical field estimates are based on specified rough surface statistics.;The scattered field magnitude provides insight into the nature of the rough surface statistics, but the phase of the scattered field is of at least equal importance when differentiating surface characteristics using a pulse echo system. The distribution of the scattered phase has been characterized for surfaces of increasing surface roughness.;An experimental verification of the theoretical formulations developed in this research is possible using a linear FM scheme for measuring the received signal amplitude versus frequency and incident angle from arbitrary surfaces. Experimental results are compared with the numerical modeling results.
机译:从超声界面散射的场的确定是超声和光学领域中相当感兴趣的领域。表面粗糙度的影响可能在总散射场中占主导地位,因此,对于确定性或统计性描述的表面,量化这些影响非常重要。粗糙表面散射的应用包括表面质量的无损评估,表面不规则性(如裂纹和缺陷)的表征以及基于表面特性的样品区分。;本研究的目标是开发一种精确的建模工具来预测表面粗糙度。来自确定性表面或随机表面的散射场。确定散射效应的经典方法是基尔霍夫理论。出于准确性,有效性和计算效率的考虑,将使用场量的角度频谱表示的另一种方法与经典Kirchhoff理论进行了比较。从确定性不规则表面散射的场的基尔霍夫和角谱表示法构成了这项研究的基础。完成了使用这两种从一维和二维粗糙度的确定性表面散射的场的表示的模拟,以评估表面描述符的影响,包括相关函数,相关长度,表面高度分布和RMS表面高度。基尔霍夫(Kirchhoff)理论和角谱理论都得到了扩展,可以预测从一维或二维随机表面散射的场的大小。这些统计场估计是基于指定的粗糙表面统计数据进行的;散射场的大小可以深入了解粗糙表面统计的性质,但是当使用脉冲回波系统区分表面特征时,散射场的相位至少具有同等的重要性。对于表面粗糙度增加的表面,已经表征了散射相的分布。;使用线性FM方案测量从任意表面接收的信号幅度与频率和入射角的关系,可以对本研究中开发的理论公式进行实验验证。将实验结果与数值模拟结果进行比较。

著录项

  • 作者

    Dean, Brita Jayne.;

  • 作者单位

    Worcester Polytechnic Institute.;

  • 授予单位 Worcester Polytechnic Institute.;
  • 学科 Electrical engineering.;Optics.
  • 学位 Ph.D.
  • 年度 1997
  • 页码 246 p.
  • 总页数 246
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 11:49:10

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