Control of metrological process variability.

摘要

This project examines the feasibility of controlling metrological process variability in the metrology laboratory. Given the understanding that variability in a measurement process is a source of measurement uncertainty, methods are defined which allows the Metrologist to measure and understand the significance of such. These methods include gauge repeatability and reproducibility (GR&R) studies, statistical process control (SPC) programs, and measurement assurance programs (MAP's). Use of methods such as loss analysis and process variability reduction (PVR) are explored. Strategies are defined for managing the measurement process variability that is inherent in any of the hundreds of independent measurement processes that may exist within the metrology laboratory. Results from the application of these methods and strategies to four different test case measurement processes are presented and analyzed.