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Microscale material testing of single crystalline silicon.

机译:单晶硅的微型材料测试。

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摘要

The mechanical properties of single crystalline silicon (SCS) in microscale are characterized using a uniaxial tension test. The samples are prepared using, various micromachining techniques. The dimensions of the tension specimen at the maximum stress region are 5 to 10 μm in thickness and 20 to 100 μm in width. The sample has two illumination marks on the top surface for strain measurement. The uniaxial tension test setup has been built to accommodate requirements such as sample handling, sample alignment, and friction elimination. Stress is measured using a commercial load cell. Strain is measured by laser interferometry. All the components are connected to a data acquisition board and controlled by a personal computer. Measured Young's moduli in three directions agree well with the reference values and verify the reliability of the setup and measurement procedure. The measured fracture strength is 0.6 GPa to 1.2 GPa, depending on sample preparation methods and loading directions. Preliminary work for fracture toughness measurements using a sharp initial crack is also presented. Future works include further investigation of fracture surfaces, fracture toughness measurement using crack opening criteria, and improvement of the testing apparatus.
机译:使用单轴拉伸试验来表征微米级单晶硅(SCS)的机械性能。使用各种微加工技术制备样品。在最大应力区域,拉伸试样的尺寸为厚度5至10μm,宽度20至100μm。样品的顶面上有两个照明标记,用于应变测量。单轴张力测试设置旨在满足样品处理,样品对齐和消除摩擦等要求。使用商业称重传感器测量应力。应变通过激光干涉仪测量。所有组件都连接到数据采集板并由个人计算机控制。在三个方向上测得的杨氏模量与参考值非常吻合,并验证了设置和测量程序的可靠性。测得的断裂强度为0.6 GPa至1.2 GPa,具体取决于样品制备方法和加载方向。还介绍了使用锋利的初始裂纹进行断裂韧性测量的初步工作。未来的工作包括对断裂表面的进一步研究,使用裂缝开口标准的断裂韧性测量以及测试设备的改进。

著录项

  • 作者

    Yi, Taechung.;

  • 作者单位

    University of California, Los Angeles.;

  • 授予单位 University of California, Los Angeles.;
  • 学科 Engineering Mechanical.; Engineering Materials Science.; Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2000
  • 页码 137 p.
  • 总页数 137
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 机械、仪表工业;工程材料学;无线电电子学、电信技术;
  • 关键词

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