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Advanced metallization and applications to large area active matrix arrays and polysilicon thin film transistors.

机译:先进的金属化技术及其在大面积有源矩阵阵列和多晶硅薄膜晶体管中的应用。

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摘要

This dissertation investigates and develops novel metallization processes for the fabrication of active matrix arrays of polysilicon devices. Particular emphasis is placed on metallization processes suitable for application to the new field of active matrix organic light emitting diode (AMOLED)) display technology. Specifically, this dissertation includes: (1) the development of a robust metallization suitable for AMOLED display fabrication; (2) determines the thermal and chemical stabilities of nickel and cobalt silicide and incorporates a silicidation process into an AMOLED display fabrication sequence; and (3) develops a process for fabricating the first polysilicon devices and circuits on stainless steel substrates, for possible use in an AMOLED process.; A study of bilayer metal films (aluminum with titanium, cobalt or nickel) exposed to a variety of annealing conditions was conducted in order to develop interconnect metallizations for AMOLED and other large area array applications. This resulted in the development and adoption of a successful nickel-aluminum bilayer metallization that succeeded in suppressing hillock formation, formed ohmic contacts to ITO, and proved an effective etchant stop to aqueous hydrofluoric acid. The interfacial reactions of the various bilayers were examined and used to explain the behavior of the different films.; Cobalt and nickel silicides were tested for their usefulness in a low temperature silicidation process that could be incorporated into a process sequence for fabricating a large area array of polysilicon devices. The relative thermal and chemical stabilities of nickel and cobalt silicides were examined and compared, and the nickel silicide was chosen as the better candidate, proving to be stable when exposed to a variety of chemistries and was successfully incorporated into the AMOLED display process flow. The thermal and chemical reactions involved were investigated and discussed with respect to the relative advantages of these two silicidation processes.; The first polysilicon devices and circuits were fabricated on steel substrates. This use of steel substrates offers the possibility of a flexible substrate having a high thermal budget compatible with an inexpensive polysilicon process. This work on microelectronic processing on stainless steel also creates the possibility of an inexpensive roll-to-roll manufacturing sequence. The processes for successfully fabricating polysilicon devices and circuits on steel substrates are detailed, and the effects of the steel substrate on device performance are derived and demonstrated.
机译:本文研究和开发了新型的金属化工艺,用于制造多晶硅器件的有源矩阵阵列。特别强调适合于应用于有源矩阵有机发光二极管(AMOLED)显示技术新领域的金属化工艺。具体而言,本论文包括:(1)开发适合AMOLED显示器制造的坚固金属化层; (2)确定镍和硅化钴的热稳定性和化学稳定性,并将硅化过程纳入AMOLED显示器的制造过程; (3)开发一种在不锈钢基板上制造第一批多晶硅器件和电路的工艺,以用于AMOLED工艺。为了开发用于AMOLED和其他大面积阵列应用的互连金属,对暴露于各种退火条件下的双层金属膜(铝,钛,钴或镍)进行了研究。这导致成功开发并采用了镍铝双层金属化层,该金属化层成功地抑制了小丘的形成,与ITO形成了欧姆接触,并证明了对氢氟酸水溶液的有效腐蚀停止作用。检查了各种双层的界面反应,并用来解释不同薄膜的行为。测试了钴硅化镍和镍硅化物在低温硅化工艺中的有用性,该工艺可并入制造大面积多晶硅器件阵列的工艺流程中。对镍和钴硅化物的相对热稳定性和化学稳定性进行了检查和比较,并选择了硅化镍作为更好的候选者,事实证明,在暴露于各种化学物质时,硅化物是稳定的,并成功地纳入了AMOLED显示工艺流程。就这两种硅化过程的相对优势,对涉及的热化学反应进行了研究和讨论。第一多晶硅器件和电路是在钢基板上制造的。钢基底的这种使用提供了具有与廉价的多晶硅工艺兼容的高热预算的柔性基底的可能性。在不锈钢上进行微电子加工的这项工作还创造了廉价的卷对卷制造顺序的可能性。详细介绍了在钢基板上成功制造多晶硅器件和电路的工艺,并推导并论证了钢基板对器件性能的影响。

著录项

  • 作者

    Howell, Robert Samuel.;

  • 作者单位

    Lehigh University.;

  • 授予单位 Lehigh University.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2001
  • 页码 203 p.
  • 总页数 203
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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