Development and application of a novel near-field microwave probe for local broadband characterization of ferromagnetic resonance.

摘要

A novel near-field microwave probe is developed for the characterization of magnetic materials. The ferromagnetic resonance probe consists of a shorted micro-coax, where the current path is a Cu thin film that sits on top of a focused ion beam deposited buffer layer. The buffer layer creates a mechanically more robust probe and leads to an increase in sensitivity. This is demonstrated through measurements on a broad range of samples, from common magnetic materials such as NiFe, to advanced materials such as multiferroic nanocomposites, where the magnetization dynamics are more complex. The data from these measurements are used to extract parameters on both the static and dynamic properties of the probed sample, such as the anisotropy field and the intrinsic magnetic damping. These parameters are important in the design of magneto-electronic devices, like the components of a hard drive in the magnetic recording industry. The main attributes of this technique are that it is broadband, it is local with the potential to achieve higher spatial resolution, and it is a non-contact method, although it is possible to measure a material while in contact. Because of the probe's metallic tip, and the ability to come in contact with the sample, it was possible to extend the measurements to both magnetically and electrically characterize the multiferroic material, which is of interest for an advanced media concept (Electrically Assisted Magnetic Recording). Finally, the probe can also measure samples of any form factor (e.g. wafers, media disc, chips), and can therefore be used to characterize devices in their working environment, or between fabrication steps.