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Experimental assessment of electronic package deformation using optical full-field deformation measurement system.

机译:使用光学全场变形测量系统对电子包装变形进行实验评估。

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摘要

Over the past several decades, experimental solid mechanics has played an important role in the highly interdisciplinary field of electronic packaging. Optical full-field deformation measurement techniques including moire systems and digital image correlation (DIC) have been mostly adopted and applied to the experimental mechanics of electronic packages. Especially, DIC technique combined with other imaging systems was selected in this research due to its practical advantages. By using this technique, in this research, there are three major experimental mechanics developed to assess various deformation behaviors of electronic packages.;For the experimental assessment, thermo-mechanical behavior of solder joints, 2-D microscopic DIC technique was utilized to quantify the deformation behavior and strains of a solder bump of flip-chip package subjected to thermal loading. The computed full-field displacement fields clearly depicted both normal and shear deformation of the solder bump under the thermal loading. In addition, the strain trends of solder bumps were effectively analyzed with respect to the distance to neutral point (DNP). Subsequently, FEA model was performed to optimize underfill material properties in order to improve the reliability of solder bump under thermal cycling.;Plastic encapsulated electronic packages absorb moisture when they are subjected to humid ambient conditions. Then, the absorbed moisture in the material influences the mechanical properties. In this study, hygroscopic material properties of the mold compound used in the MEMS package were characterized. From the desorption measurement after preconditioning at 85ºC/85%RH, the saturated moisture content and diffusivity were obtained. In addition, a new experimental setup was devised using DIC system together with a precision weight scale in order to obtain the coefficient of hygroscopic swelling at different temperatures. Using the obtained hygroscopic material properties, FEA model was performed to understand conjugated hygro and thermo-mechanical behavior of a MEMS package during a reflow process after moisture preconditioned.;Cellular phones and other handheld electronic devices are often exposed to severe shock/drop impact loading. These transient and dynamic deformations of electronic assemblies have been measured by using DIC with stereo-high-speed camera. In order to protect electronic components of electronic devices on a Printed Circuit Board (PCB) against electromagnetic radiation, a conductive shield-can or box is normally attached on the PCB covering the electronic components. In this regard, the effect of shield-can to the dynamic behavior of PCB was investigated.
机译:在过去的几十年中,实验固体力学在高度交叉的电子包装领域中发挥了重要作用。包括波纹系统和数字图像相关性(DIC)在内的光学全场变形测量技术已被广泛采用,并应用于电子封装的实验力学。特别是,由于其实际优势,本研究选择了与其他成像系统相结合的DIC技术。通过使用这种技术,本研究开发了三种主要的实验机制来评估电子封装的各种变形行为。为了进行实验评估,利用焊点的热机械行为,利用二维微观DIC技术对焊点的热力学行为进行量化。倒装芯片封装的焊料凸点的热变形行为和应变。计算得出的全场位移场清楚地描述了热负荷下焊料凸块的法向变形和剪切变形。另外,有效地分析了相对于中性点的距离(DNP)的焊料凸点的应变趋势。随后,进行了FEA模型以优化底部填充材料的性能,以提高热循环下焊料凸点的可靠性。塑料封装的电子封装在潮湿的环境下会吸收水分。然后,材料中吸收的水分会影响机械性能。在这项研究中,表征了在MEMS封装中使用的模塑料的吸湿材料特性。通过在85ºC/ 85%RH进行预处理后的解吸测量,可以获得饱和水分含量和扩散率。此外,使用DIC系统和精确的体重秤设计了一种新的实验装置,以便获得不同温度下的吸湿膨胀系数。利用获得的吸湿材料特性,进行FEA模型以了解MEMS封装在湿气预处理后的回流过程中的共轭吸湿和热机械行为。;蜂窝电话和其他手持式电子设备经常受到严重的冲击/跌落冲击负荷。电子组件的这些瞬态和动态变形已通过将DIC与立体声高速相机配合使用进行了测量。为了保护印刷电路板(PCB)上的电子设备的电子组件免受电磁辐射,通常将导电的屏蔽罐或盒子连接到PCB上,覆盖电子组件。在这方面,研究了屏蔽罐对PCB动态行为的影响。

著录项

  • 作者

    Kwak, Jae B.;

  • 作者单位

    State University of New York at Binghamton.;

  • 授予单位 State University of New York at Binghamton.;
  • 学科 Engineering Mechanical.
  • 学位 Ph.D.
  • 年度 2010
  • 页码 115 p.
  • 总页数 115
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 水产、渔业;
  • 关键词

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