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Substrate engineering for defect reduction and microstructure control in the growth of indium arsenide on (100) gallium arsenide.

机译:用于减少(100)砷化镓上砷化铟生长的缺陷减少和微结构控制的基板工程。

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摘要

The development of devices based on InAs, GaSb, and AlSb, semiconductors that possess narrow band-gaps and 0.61 nm lattice parameters, has been limited by the defects that ensue in epitaxial films that typically are grown on commercial semi-insulating, but 7% lattice-mismatched, GaAs substrates. The studies described in this dissertation investigate the application of a lateral epitaxial overgrowth technique for defect reduction and microstructure control to the InAs/GaAs heteroepitaxial system by exploring the development of microstructure at various stages of island and film growth in conventional and lateral overgrowth epitaxy (that is, on unpatterned and mask-patterned substrates, respectively). For a range of growth conditions, InAs films on unpatterned (100) GaAs substrates exhibit not only the threading dislocations characteristic of largely mismatched epitaxial films, but also systematic tilting within micron-scale InAs domains. Alteration of the pattern and magnitude of the tilt achieved by varying the growth conditions and/or introducing mask-patterned substrates suggest that not only chemical and kinetic, but also physical constraints can direct microstructural evolution during growth. Backscattered electron Kikuchi pattern-based orientation imaging was used to investigate the origin of the improved epitaxial alignment that is realized when InAs films were grown on mask-patterned (100) GaAs substrates. The island size at coalescence was shown to be critical in determining whether a single or two-fold, four-fold or six-fold epitaxial orientation relationship(s) is (are) present in the film. The evolution of tilt with increasing island size is attributed to the particulars of the misfit dislocation network that forms, which appears to evolve in this epitaxial system as the island grows, in accordance with a model proposed by Spencer and Tersoff [1,2]. Sub-micron (∼0.5 mum or less) island sizes at coalescence appear to lead to a single orientation aligned with the GaAs.; This work shows that spatial constraints imposed at the early stages of growth, in this case through use of a mask-patterned substrate, can be used to promote coalescence at small island size as an alternative or parallel approach to setting growth conditions (temperature, precursor stoichiometry, etc.) in order to control the defect nucleation and microstructure.; References. [1]. B.J. Spencer, and J. Tersoff, Appl. Phys. Lett. 77 (1997) 2533. [2]. B.J. Spencer, and J. Tersoff, Phys. Rev. B63 (2001) 205424.
机译:具有窄带隙和0.61 nm晶格参数的基于InAs,GaSb和AlSb的器件的开发受到通常在商用半绝缘材料上生长的外延膜中出现的缺陷的限制,但有7%的缺陷。晶格不匹配的GaAs衬底。本文探讨了横向外延过度生长技术在InAs / GaAs异质外延系统中减少缺陷和控制微观结构的应用,方法是探索常规和横向过度生长外延在岛和膜生长各个阶段的微观结构的发展(即分别在未图案化和掩模图案的基板上)。对于一定范围的生长条件,无图案(100)GaAs衬底上的InAs膜不仅表现出很大程度上不匹配的外延膜的穿线位错特征,而且还表现出微米级InAs域内的系统倾斜。通过改变生长条件和/或引入掩模图案化的基板实现的倾斜模式和倾斜幅度的改变表明,不仅化学和动力学因素,而且物理限制因素都可以指导生长过程中的微结构演变。基于背散射电子菊池图案的取向成像用于研究在掩模图案(100)GaAs衬底上生长InAs膜时实现的改善的外延对准的起源。在确定膜中是否存在单或两倍,四倍或六倍的外延取向关系时,聚结时的岛尺寸被证明是至关重要的。倾斜随着岛尺寸的增加而发生的演化归因于形成的错配位错网络的特殊性,根据Spencer和Tersoff提出的模型[1,2],该错位错位网络似乎随着该岛的增长而在该外延系统中演化。聚结时亚微米(约0.5微米或更小)的岛尺寸似乎导致与GaAs对准的单一取向。这项工作表明,在生长的早期阶段施加的空间限制(在这种情况下,通过使用掩模图案的基材)可用于促进小岛尺寸的聚结,作为设置生长条件(温度,前体化学计量等),以控制缺陷的形核和微观结构。参考文献。 [1]。 B.J. Spencer和J.Tersoff,应用物理来吧77(1997)2533. [2]。 B.J. Spencer和J.Tersoff,物理学。 B63版(2001)205424。

著录项

  • 作者

    Ganesan, Suryanarayanan.;

  • 作者单位

    The University of Wisconsin - Madison.;

  • 授予单位 The University of Wisconsin - Madison.;
  • 学科 Engineering Metallurgy.; Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2006
  • 页码 185 p.
  • 总页数 185
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 冶金工业;工程材料学;
  • 关键词

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