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Modeling of the Frequency Dependent Detective Quantum Efficiency of X-Ray Imaging Detectors.

机译:X射线成像探测器的频率相关探测量子效率建模。

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摘要

Direct conversion flat panel x-ray imaging detector is presently one of the important tools in medical diagnosis of a patient. It provides an excellent image quality, portability, and dose utilization. Amorphous selenium based direct conversion detector with an active matrix array has been in the focus of researchers for the last two decades and extensive work and improvement have been done on this. There are several parameters of an x-ray imaging detector through which the imaging performance of a detector could be measured. The most important measure is the frequency, f, dependent detective quantum efficiency, DQE(f). In this thesis, we have proposed a parallel cascaded linear system model for calculating DQE(f) by considering the effects of K-fluorescence reabsorption, the range of primary photo electrons, charge carrier trapping, aperture function, noise aliasing, and addition of electronic noise. DQE (Detective Quantum Efficiency) depends significantly on the transport properties (mobility-lifetime product) and the creation of K-fluorescent x-ray photons. The DQE model is applied to fluoroscopic and mammographic detectors and is validated with the recent published experimental data. It has been found that the DQE(f) can be improved by ensuring that the carrier with the higher mobility-lifetime product is drifted towards the pixel electrode, i.e., the bottom electrode of the detector. A simplified zero spatial frequency, DQE(0), is also proposed in this thesis. There exists an optimum detector thickness that maximizes the DQE under charge carrier trapping. Although the model is applied to Amorphous Selenium (a-Se) and Mercuric Iodide (HgI2) based imaging detectors, it can also be applied to analyze the DQE(f) performance of the imaging detectors based on other photoconductive materials like CdZnTe, PbI2 etc.
机译:直接转换平板X射线成像检测器目前是患者医学诊断中的重要工具之一。它提供了出色的图像质量,便携性和剂量利用率。在过去的二十年中,具有有源矩阵阵列的基于硒的非晶态直接转换检测器一直是研究人员关注的焦点,对此已进行了广泛的工作和改进。 X射线成像检测器有几个参数,通过这些参数可以测量检测器的成像性能。最重要的度量是频率f,取决于检测量子效率DQE(f)。在本文中,我们考虑了K荧光重吸收,一次光电子的范围,电荷载流子俘获,孔径函数,噪声混叠和添加电子的影响,提出了用于计算DQE(f)的并行级联线性系统模型。噪声。 DQE(探测量子效率)在很大程度上取决于传输性质(迁移率终生乘积)和K荧光X射线光子的产生。 DQE模型已应用于荧光检查和乳腺X射线检测器,并已通过最近发布的实验数据进行了验证。已经发现,通过确保具有较高迁移率-寿命乘积的载体朝着像素电极即检测器的底部电极漂移,可以改善DQE(f)。本文还提出了一种简化的零空间频率DQE(0)。存在一个最佳检测器厚度,该厚度可使电荷载流子俘获下的DQE最大化。尽管该模型适用于基于非晶硒(a-Se)和碘化汞(HgI2)的成像探测器,但它也可以用于分析基于其他光电导材料(如CdZnTe,PbI2等)的成像探测器的DQE(f)性能。 。

著录项

  • 作者

    Rahman, Md. Wasiur.;

  • 作者单位

    Concordia University (Canada).;

  • 授予单位 Concordia University (Canada).;
  • 学科 Computer Science.
  • 学位 M.A.Sc.
  • 年度 2010
  • 页码 81 p.
  • 总页数 81
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 11:36:59

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