【24h】

Sub-picosecond exciton spin-relaxation in GaN

机译:GaN中的亚皮秒激子自旋弛豫

获取原文
获取原文并翻译 | 示例

摘要

Exciton spin relaxations in bulk GaN were directly observed with sub-picosecond's time resolution. The obtained spin relaxation times of A-band free exciton are 0.47 ps - 0.25 ps at 150 K - 225 K. The spin relaxation time of the acceptor bound exciton at 15K is measured to be 1.1 ps. These are at least one order of magnitude shorter than those of the other Ⅲ-Ⅴ compound semiconductors. The spin relaxation time of A-band free exciton is found to be proportional to T~(1.4), where T is the temperature. The fact that the spin relaxation time in GaN is shorter than that in GaAs, in spite of the small spin-orbit splitting, suggests that the spin relaxation is dominated by the defect-assisted Elliot-Yafet process.
机译:直接在亚皮秒的时间分辨率下观察到块状GaN中的激子自旋弛豫。在150 K-225 K时,获得的无A波段激子的自旋弛豫时间为0.47 ps-0.25 ps。在15K时,受体结合的激子的自旋弛豫时间为1.1 ps。它们比其他Ⅲ-Ⅴ族化合物半导体短至少一个数量级。发现无A激子的自旋弛豫时间与T〜(1.4)成正比,其中T为温度。尽管自旋轨道分裂很小,但GaN中的自旋弛豫时间比GaAs中的自旋弛豫时间短,这一事实表明,自旋弛豫主要由缺陷辅助的Elliot-Yafet工艺控制。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号