首页> 外文会议>Ultrafast Phenomena in Semiconductors and Nanostructure Materials X >Detection of High Frequency Acoustic Transients using Coherent EUV Light
【24h】

Detection of High Frequency Acoustic Transients using Coherent EUV Light

机译:使用相干EUV光检测高频声瞬变

获取原文
获取原文并翻译 | 示例

摘要

Ultrafast Extreme Ultraviolet (EUV) radiation is used to probe transient surface phenomenon in three experimental geometries. Optical irradiation of the sample surface generates thermal and acoustic transients that are subsequently probed with a time-delayed EUV pulse. In all experimental geometries we show excellent signal-to-noise ratios (>10:1) and increased sensitivity to surface deformations (<.02nm) directly attributable to the reduced wavelength of the probing light.
机译:超快极紫外(EUV)辐射用于探测三种实验几何形状中的瞬态表面现象。样品表面的光辐射会产生热和声瞬变,随后用延时的EUV脉冲进行探测。在所有实验几何中,我们都显示出出色的信噪比(> 10:1)和对表面变形的敏感性(<.02nm),这直接归因于探测光波长的减小。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号