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Nanoscale Silver Sintering for High-Temperature Packaging of Semiconductor Devices

机译:用于半导体器件高温封装的纳米级银烧结

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摘要

Silver nanoparticles were prepared from solution using the Carey Lea method. The silver particles obtained by this method ranged from 10nm to 30nm in diameter. Silver paste was prepared by adding terpineol to the dry silver nanopowder and mixed in a roller mill for up to 48 hours. The paste was stencil-printed on metallized substrates and heated to volatilize the binder and solvents and to sinter the metal particles. Preliminary sintering experiments showed widespread neck formation between particles at temperatures as low as 280℃. Initial die-attach tests also resulted in very strong bonding between device and substrate. This could lead to significantly lower sintering temperatures making it possible to attach both silicon and high-temperature wide-bandgap semiconductor devices using silver instead of solder, which in turn will enhance the electrical, thermal and mechanical performance and reliability of device interconnections. Additional research is ongoing and future research will include improvement in the dispersion of the nanoparticles, characterization of the densification behavior and optimizing die-attach conditions.
机译:使用Carey Lea方法从溶液中制备银纳米颗粒。通过该方法获得的银颗粒的直径为10nm至30nm。通过向干燥的银纳米粉中添加松油醇并在辊磨机中混合长达48小时来制备银浆。将糊剂模版印刷在金属化的基材上,并加热以挥发粘合剂和溶剂,并烧结金属颗粒。初步的烧结实验表明,在低至280℃的温度下,颗粒之间广泛地形成了颈部。最初的芯片连接测试还导致设备与基板之间的牢固结合。这可能导致大大降低的烧结温度,从而有可能使用银代替焊料来附着硅和高温宽带隙半导体器件,这反过来将增强器件互连的电,热和机械性能以及可靠性。正在进行其他研究,未来的研究将包括纳米颗粒分散性的改善,致密化行为的表征以及最佳的芯片附着条件。

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