Characterizations of Lamellar Interfaces and Segregations in a PST-TiAl Intel-metallic Alloy by an Analytical Scanning Transmission Electron Microscope

摘要

Polysynthetically-twinned titanium aluminide (PST-TiAl), a fully lamellar γ-TiAl + α_2-Ti_3Al dual-phase alloy, is under evaluation for applications in rotary components in aircraft and automobile industries due to its high specific strength, and a high strength-retention capability at elevated-temperatures. However, the low ductility at room- to mid-high temperatures of the material hinders its application. Additions of certain tertiary elements to the binary TiAl system appear to improve the ductility at room- to mid-high temperatures, thus a balance among strength, ductility, and fracture toughness can be expected. In this article, segregation of tertiary elements to the lamellar interfaces is investigated. Single crystals of a TiAl with 0.6% atomic percentage tertiary additions are grown by an optical float-zone method. Segregation to the lamellar interfaces and the microstructure of the interfaces are investigated. Structures of the lamellar interfaces are characterized, and microchemistry and distribution habits of these elements along the γ+α_2 lamellar boundaries as well as the γ-γ lamellar and domain boundaries are analyzed.