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GSrowth mechanism of thin film wide-gap semiconductors by chemical bath deposition technique

机译:薄膜宽禁带半导体的化学浴沉积技术生长机理

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Chemical bath deposition is a thin film technique in which semiconductor thin films of typically 0.02-1 mu m thickness are deposited on substrates immersed in dilute baths containing metal ions and a source of sulfide or seleide ions. Many I-VI, II-VI, IV-VI, and V-VI semiconductors are included in the list of materials deposited by this technique, II-VI compounds CdS, CdSe, ZnS and ZnSe being the most investigated. However, a matheratical model describing the growth mechanism of these films still remains to be established. The deposition process consists of a nucleation phase, growth phase, and a terminal phase, each of which depends on the concentration of the ions in the deposition bath, its temperature, dissociation constants of the metal complex ions, etc. In this paper w e propose a mathematical model, which can qualitatively account for most of the features of the experimentalo gowth curves of chemically deposited semiconductor films.
机译:化学浴沉积是一种薄膜技术,其中通常将厚度为0.02-1微米的半导体薄膜沉积在浸入含有金属离子和硫化物或硒离子源的稀浴中的基板上。通过该技术沉积的材料列表中包括许多I-VI,II-VI,IV-VI和V-VI半导体,其中研究最多的是II-VI化合物CdS,CdSe,ZnS和ZnSe。然而,描述这些膜的生长机理的数学模型仍有待建立。沉积过程包括成核阶段,生长阶段和结束阶段,每个阶段都取决于沉积浴中离子的浓度,其温度,金属络合物离子的解离常数等。在本文中,我们提出一个数学模型,可以定性地解释化学沉积半导体膜的实验哥德曲线的大多数特征。

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