The dielectric loss of single crystal and polycrystalline TiO_2

摘要

The dielectric loss of single crystal and polycrystalline TiO_2 has been studied. In polycrystalline TiO_2 the dielectric loss is determined by both the microstructure and by the oxygen stoichiometry. Experiments have been carried out to determine the influence of both the microstructure (particularly porosity) and the oxygen stoichiometry. The TiO_2 powder has been doped with partially stabilised zirconia, an oxygen ion conductor, in order to modify the oxygen stoichiometry. Sintered discs have been examined for loss as a function zirconia doping, pore volume and as a function of temperature. The behaviour of the doped and undoped titania powders is significantly different. Since many microwave dielectric materials contain Ti eg Ba-Ti-O, Ba-Nd-Ti-O, (Ba-RE-Ti-O, RE=Rare Earth), Zr-Sn-Ti-O etc it is essential to understand the role of the titanium, particularly as it can exist in mixed valence states, and the role of oxygen and its influence on the dielectric loss.