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Infrared reflective optical modulator

机译:红外反射光调制器

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Abstract: An IR reflective optical modulator has been fabricated. This has been achieved by coating a thick film resistor network with a thin film of vanadium dioxide via a reactive sputtering process. Vanadium dioxide undergoes a semiconductor to metal phase transition at approximately 68 degrees C, therefore to switch the reflective optical modulator the thick film resistors in the network are driven electrically. As the resistors heat up to beyond the transition temperature, the vanadium dioxide undergoes its transition from a transparent semiconductor state to a highly reflective metallic state. Provided the thick film heater network, underneath the vanadium dioxide, is non- reflective, then a significant change in reflectivity is observed upon undergoing the transition, and hence the modulation of reflected IR radiation is achieved. The useful waveband of operation of the device encompasses the region 2-25 $mu@m, this is primarily limited by the transparency of the semiconductor state of the vanadium dioxide. Correct stoichiometry of the thin film of vanadium dioxide is critical in producing good modulation depth in the reflective mode. Several devices have been fabricated and tested. They show a reflectivity increase of approximately 13:1 upon switching. The devices to date have demonstrated switch on speeds of 0.1 s and switch off speeds of 0.2 s. This has been achieved without any form of substrate temperature control apart from that produced by the electrical drive. Very slight changes in the stoichiometry of the vanadium dioxide thin film can greatly increase the temperature range and hysteresis of the semiconductor to metal phase transition. This has been utilized to allow partial phase transitions to occur, yielding partial increases in reflectivity, and hence the ability to generate grey levels in the reflected IR radiation. !6
机译:摘要:制备了红外反射光调制器。这是通过通过反应溅射工艺用二氧化钒薄膜覆盖厚膜电阻器网络来实现的。二氧化钒在大约68摄氏度下经历了半导体到金属的相变,因此要切换反射型光学调制器,必须以电方式驱动网络中的厚膜电阻器。随着电阻器加热到超过转变温度,二氧化钒经历了从透明半导体状态到高反射金属状态的转变。如果在二氧化钒下面的厚膜加热器网络是非反射性的,则在经历过渡时观察到反射率的显着变化,因此实现了对反射红外辐射的调制。该装置的有用的工作频带包括2-25μm2的区域,这主要受到二氧化钒的半导体状态的透明性的限制。二氧化钒薄膜的正确化学计量对在反射模式下产生良好的调制深度至关重要。已经制造并测试了几种设备。它们在切换时显示出约13:1的反射率增加。迄今为止,这些设备的接通速度为0.1 s,断开速度为0.2 s。除了电驱动产生的温度控制外,无需任何形式的基板温度控制即可实现。二氧化钒薄膜的化学计量的非常微小的变化可以大大增加温度范围和半导体到金属相变的滞后。这已被用于允许发生部分相变,从而导致反射率的部分增加,并因此具有在反射的IR辐射中产生灰度级的能力。 !6

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