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Temperature-Dependent PL Intensity in FLA-Synthesized and Hydrogen-Modified Silica Layers with Silicon Nanocrystals

机译:具有硅纳米晶体的FLA合成和氢改性二氧化硅层中随温度变化的PL强度

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摘要

The temperature dependence of the photoluminescence intensity I in flash-lamp-anneal-synthesized silica layers with small silicon nanocrystals (nc's) and in similar layers heat-treated in hydrogen-(H-) rich ambient was used to examine how H treatments affect the "dark" fracture of nc's and the migration paths of optically induced excitations in such systems. It can be inferred from the data obtained that the fracture of "dark" nc's in the systems of interest is generally not large, hydrogen weakly passivates defects in small-size nc's, and the influence of H treatments on the parameters governing the temperature dependence of I is insignificant.
机译:在具有小硅纳米晶(nc's)的闪光灯退火合成的二氧化硅层中以及在富含氢(H)的环境中进行热处理的类似层中,光致发光强度I的温度依赖性用于检验H处理如何影响硅的nc的“暗”断裂和此类系统中光诱导的激发的迁移路径。从获得的数据可以推断,感兴趣的系统中“暗” nc的断裂通常不大,氢弱钝化小尺寸nc中的缺陷,并且H处理对控制温度依赖性的参数的影响。我无关紧要。

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  • 来源
    《Solid state-general》|2008年|105-111|共7页
  • 会议地点 Honolulu HI(US);Honolulu HI(US);Honolulu HI(US)
  • 作者单位

    Institute of Semiconductor Physics, Russian Academy of Sciences, Siberian Division, Novosibirsk 630090, Russia;

    Institute of Semiconductor Physics, Russian Academy of Sciences, Siberian Division, Novosibirsk 630090, Russia;

    Institute of Semiconductor Physics, Russian Academy of Sciences, Siberian Division, Novosibirsk 630090, Russia;

    Institute of Semiconductor Physics, Russian Academy of Sciences, Siberian Division, Novosibirsk 630090, Russia;

    Forschungszentrum, Rossendorf, Dresden 01314, Germany;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料一般性问题;
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