Effect of the spectral width on mode partition noise in multimode VCSELs

摘要

The dependence of the mode partition noise (MPN) and the power penalty associated with it can be measuredfrom the source spectral width. Our findings show that there is strong dependence of the carrier lifetime onthe bit error rate degradation caused by MPN on the spectral width of the vertical cavity surface emitting laser(VCSEL). VCSELs with smaller spectral width (shorter carrier lifetime) exhibited smaller MPN induced powerpenalty. We found that the theoretical calculation of the power penalties caused by MPN from the carrier lifetimeand the spectral width is in good agreement with the measured system penalties.