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CRACK SUSCEPTIBILITY OF BINARY ALUMINUM ALLOYS: ANALYTICAL EQUATIONS

机译:二元铝合金的裂纹敏感性:解析方程

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The crack susceptibility curves (crack susceptibility v.v. solute content C_0) of binary Al alloy systems were calculated by plotting the maximum | dT/d(fs)~(1/2) | vs. C_0, where T is temperature, fs fraction solid, and the maximum | dT/d(fs)~(1/2) | a crack susceptibility index proposed and verified recently. Two simple equations were derived based on binary phase diagrams with straight solidus and liquidus lines to calculate the location (C_0)_(peak) and height | dT/d(fs)~(1/2) |_(peak) of the peak of the crack susceptibility curve without having to calculate the curve first. The effect of the eutectic line, liquidus line and solidus line of a eutectic phase diagram on the crack susceptibility was demonstrated. Erst, | dT/d(fs)~(1/2) |_(peak) tends to decrease when the eutectic line is raised, the liquidus line steepened, or the solidus line made shallower. Second, back diffusion tends to increase (C_0)_(peak) and decrease | dT/d(fs)~(1/2) |_(peak). These tendencies agreed with the two equations and with the reported crack susceptibility of Al-Si and Al-Mg alloy systems.
机译:二元铝合金系统的裂纹敏感性曲线(裂纹敏感性v.v.溶质含量C_0)通过绘制最大| dT / d(fs)〜(1/2)| vs. C_0,其中T是温度,fs固体分数和最大值| dT / d(fs)〜(1/2)|最近提出并验证了裂纹敏感性指数。根据具有直的固相线和液相线的二元相图,导出了两个简单的方程,以计算位置(C_0)_(peak)和height |。裂纹敏感性曲线的峰值的dT / d(fs)〜(1/2)| _(peak),而不必先计算该曲线。证明了共晶相图的共晶线,液相线和固相线对裂纹敏感性的影响。厄斯特|当共晶线升高,液相线变陡或固相线变浅时,dT / d(fs)〜(1/2)| _(peak)趋于降低。其次,反向扩散倾向于增加(C_0)_(peak)并减小| dT / d(fs)〜(1/2)| _(峰值)。这些趋势与两个方程式以及已报道的Al-Si和Al-Mg合金体系的裂纹敏感性相吻合。

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