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Optical inspection of MOEMS devices using a configurable and suitable for production image processing system

机译:使用可配置且适用于生产图像处理系统的MOEMS设备的光学检查

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摘要

This contribution describes a fully automated optical inspection system suited for end test of MOEMS which are fabricated in large volume. The system consists on one hand of necessary handling tools for MOEMS which are not necessarily part of a rigid wafer. On the other hand, a crucial part is an image processing system that can be adapted to changing requirements on accuracy for different parts of one MOEMS device as well as allows easy reconfiguration of the complete image analysis for diverse MOEMS types. First proof of usability has been obtained for micro scanning mirrors developed at Fraunhofer IPMS.
机译:该文稿描述了一种全自动光学检测系统,适用于大批量制造的MOEMS的最终测试。该系统一方面包括用于MOEMS的必要处理工具,这些工具不一定是刚性晶片的一部分。另一方面,关键部分是图像处理系统,该系统可以适应不断变化的MOEMS设备不同部分对精度的要求,并且可以轻松地为各种MOEMS类型重新配置完整的图像分析。 Fraunhofer IPMS开发的微扫描镜已经获得了可用性的第一个证明。

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