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EPITAXIAL TRANSPARENT CONDUCTING OXIDE FILMS BY PLD

机译:通过PLD的表观透明导电氧化物薄膜

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摘要

Novel transparent conducting oxides (TCOs) are required for a new generation of optoelectronic devices including higher performance photovoltaic and display devices. We have employed pulsed laser deposition (PLD) to explore performance limits and fundamental properties of n- and p-type materials. We report here on results for n-type materials in the ZnSnO_x and In_2O_3:Mo oxide systems and on CuInO_2:Ca as a p-type material. Key results for the n-type materials have been the observation of higher mobilities, doping levels and conductivities in amorphous ZnSnO_3 and epitaxial films of Zn_2SnO_4 and the observation of very high mobilities (125 cm~2/Vsec) along with excellent transparency ( > 90%) in the Mo-doped In_2O_3. For the p-type materials, we have obtained improved conductivities in Ca-doped CuInO_2 (0.06 Ω~(-1) cm~(-1)). PLD is shown to be a powerful technique for establishing performance limits for TCOs.
机译:包括更高性能的光伏和显示设备在内的新一代光电设备都需要新型透明导电氧化物(TCO)。我们已采用脉冲激光沉积(PLD)来探索n型和p型材料的性能极限和基本性能。我们在此报告ZnSnO_x和In_2O_3:Mo氧化物系统中的n型材料的结果以及CuInO_2:Ca作为p型材料的结果。 n型材料的主要结果是观察到非晶ZnSnO_3和Zn_2SnO_4外延膜中的较高迁移率,掺杂水平和电导率,以及观察到非常高的迁移率(125 cm〜2 / Vsec)和出色的透明度(> 90 %)在Mo掺杂的In_2O_3中。对于p型材料,我们在掺杂Ca的CuInO_2(0.06Ω〜(-1)cm〜(-1))中获得了改善的电导率。 PLD被证明是为TCO建立性能极限的强大技术。

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