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Configuration of AEC kVp dependence for digital radiography systems

机译:用于数字射线照相系统的AEC kVp依赖性配置

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As digital radiography (DR) systems are being increasingly adopted for clinical applications, automatic exposure control (AEC) has remained a critically important component. Unlike traditional screen/film systems, however, there does not currently exist a widely accepted AEC calibration criterion for DR systems. This is due mainly to the signal response characteristics and wide dynamic range of DR detectors, which are inherently different from those of a screen/film system. Consequently, the AEC cutoff dose and its dependence on the kVp selection (i.e., kVp compensation) should be calibrated differently for DR systems. In this paper, we have investigated three possible schemes to set up the AEC compensation based on a constant response of the detector in terms of the signal, receptor dose, and signal-to-noise ratio (SNR). The results for each setup scheme was evaluated on four different DR detectors (Gd_2O_2S, CsI(Tl), a-Se, or BaFBrI as X-ray absorption material) based on the measured signal and noise response of the detector under the ISO beam conditions (ISO 6236-1). The results showed that all three setup schemes produced similar results for clinical beams above 70 kVp. Significant differences were observed only at lower kVp ( ≤ 60) beams. In addition, schemes of constant signal and constant SNR produced similar results with the only exception being the a-Se detector at low kVp ( ≤ 60) beam. These results indicate that the choice of the kVp schemes would be important only for low kVp exams.
机译:随着数字射线照相(DR)系统越来越多地用于临床应用,自动曝光控制(AEC)仍然是至关重要的组件。但是,与传统的银幕/电影系统不同,目前还没有针对DR系统的广泛接受的AEC校准标准。这主要归因于DR检测器的信号响应特性和宽动态范围,这与屏幕/电影系统的本质不同。因此,对于DR系统,应以不同的方式校准AEC截止剂量及其对kVp选择的依赖性(即kVp补偿)。在本文中,我们研究了三种可能的方案,以基于检测器在信号,受体剂量和信噪比(SNR)方面的恒定响应来建立AEC补偿。根据在ISO光束条件下探测器的测量信号和噪声响应,在四个不同的DR探测器(Gd_2O_2S,CsI(Tl),a-Se或BaFBrI作为X射线吸收材料)上评估每种设置方案的结果(ISO 6236-1)。结果表明,对于70 kVp以上的临床光束,所有三种设置方案均产生了相似的结果。仅在较低kVp(≤60)的光束中观察到显着差异。此外,恒定信号和恒定SNR的方案产生了相似的结果,唯一的例外是在低kVp(≤60)光束下的a-Se检测器。这些结果表明,kVp方案的选择仅对低kVp考试很重要。

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