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Validation of simulated point response of columnar phosphor screens

机译:验证柱状荧光屏的模拟点响应

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Typical methods to measure the resolution properties of x-ray detectors use slit or edge devices. However, complete models of imaging systems for system optimization require knowledge of the point-response function of the detector. In this paper, we report on the experimental methods developed for the validation of the point-response function of an indirect columnar CsI:Tl detector predicted by Monte Carlo using MANTIS. We describe simulation results that replicate experimental resolution measurements using edge and pinhole devices. The experimental setup consists of a high-resolution CCD camera with a 1-to-1 fiber optic faceplate that allows measurements for different scintillation screens. The results of these experiments and simulations constitute a resource for the development and validation of the columnar models of phosphor screens proposed as part of previous work with MANTIS. We compare experimental high-resolution pinhole responses of two different CsI(Tl) screens to predictions from MANTIS. The simulated response matches reasonably well the measurements at normal and off-normal x-ray incidence angle when a realistic pinhole is used in the simulation geometry. Our results will be combined with results on Swank factors determined from Monte Carlo pulse-height spectra to provide a comprehensive validation of the phosphor models, therefore allowing their use for in silico system optimization.
机译:测量X射线探测器分辨率特性的典型方法是使用狭缝或边缘设备。但是,用于系统优化的完整成像系统模型需要了解检测器的点响应功能。在本文中,我们报告了为验证由蒙特卡洛使用MANTIS预测的间接柱状CsI:Tl检测器的点响应功能而开发的实验方法。我们描述了使用边缘和针孔设备复制实验分辨率测量结果的仿真结果。实验装置包括一台高分辨率CCD相机和一个一对一的光纤面板,该面板可以测量不同的闪烁屏幕。这些实验和模拟的结果构成了开发和验证荧光粉屏幕柱状模型的资源,该荧光粉柱模型是MANTIS先前工作的一部分。我们将两种不同的CsI(Tl)屏幕的实验高分辨率针孔响应与MANTIS的预测进行比较。当在模拟几何中使用实际的针孔时,模拟响应在法向和法线X射线入射角下的测量值匹配得很好。我们的结果将与从蒙特卡洛脉冲高度谱确定的Swank因子的结果相结合,以对磷光体模型进行全面验证,因此可将其用于计算机系统优化。

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