Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 291 Daehak-ro, Yuseong-gu, Daejeon 305-701, Korea;
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 291 Daehak-ro, Yuseong-gu, Daejeon 305-701, Korea;
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 291 Daehak-ro, Yuseong-gu, Daejeon 305-701, Korea;
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 291 Daehak-ro, Yuseong-gu, Daejeon 305-701, Korea;
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 291 Daehak-ro, Yuseong-gu, Daejeon 305-701, Korea;
机译:与砷掺杂比较研究原位掺杂硼的Si选择性外延生长
机译:掺杂硼的外延CVD金刚石层的原子组成和电气特性(Vol 50,PG 1569,2017)
机译:掺杂气体对生长速率轴向均匀性和LPCVD原位掺杂多晶硅层电学性能的影响
机译:使用热线CVD在VIC加工聚乙片种子层对Si外延生长的原位硼掺杂的影响
机译:有限元模拟掺硼硅层的固相外延生长。
机译:多层氮掺杂外延生长法制备的CVD单晶金刚石的界面和力学性能
机译:热壁LpCVD生长4H-siC同质外延层中的原位硼和铝掺杂及其记忆效应