Series resistance as a function of current and its application in solar cell analysis 37th IEEE photovoltaic specialists conference

摘要

The series resistance of a solar cell varies with its operating conditions. However, most solar cell characterization is done by assuming the series resistance is represented as a constant value. This paper presents the application of the multi light method to extract Rs-light and Rs-dark as a function of current. Application of Rs(J) to analysis of solar cell is demonstrated by extracting the Rs-corrected J-V curve. This allows evaluation of the p-n junction without the parasitic Rs effects. Since the Rs(J) and Rs-corrected J-V data is measured in high detail, the total losses from the Rs and the pseudo efficiency can be measured without need of curve fitting. Finally, by including Rs(J) to the modelling of solar cells, errors in parameterization caused by variation in Rs value is eliminated.