In situ crystal growth imaging during explosive crystallization

摘要

Explosive crystallization of amorphous germanium of 0.89 and 1.80 microns in thickness deposited on quartz substrates was investigated. A scalloped, mixed, and columnar regime was observed. In situ images captured using dark field imaging reveal the shape of the explosive crystallization front. Crystallization was induced by a frequency tripled Nd:YAG laser (λ = 355 nm) focused to a tight line. A second Nd:YAG laser was frequency doubled (λ = 532 nm) and used as an illumination source for two time resolved pictures. The shape and speed of the explosive crystallization front is observed for various heat loss parameters and crystallization regimes and is generally in good agreement with the literature. Surface morphology is inspected by Atomic Force Microscopy (AFM) after explosive crystallization has completed.