• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文会议>Modelling, simulation, and identification >POWER LOSSES ON GRAIN ORIENTED AND NON-GRAIN ORIENTED MATERIALS USING EPSTEIN TEST FOR ELECTRICAL MACHINE DESIGN
【24h】

POWER LOSSES ON GRAIN ORIENTED AND NON-GRAIN ORIENTED MATERIALS USING EPSTEIN TEST FOR ELECTRICAL MACHINE DESIGN

机译：电机设计中使用EPSTEIN测试的谷物取向和非谷物取向材料的功率损耗

获取原文
获取原文并翻译 | 示例
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Modeling and definition of procedures leading to a good estimation of power losses in electrical machines from materials test data still is a challenge. The materials used in this experiment are grain oriented (GO) and non-grain oriented (NGO) electrical steel. In this paper, Epstein frame is optimized for both materials and the data is presented based on 50 Hz. The leakage flux also investigated during power loss measurements at the corner and limb as well.
机译：从材料测试数据中很好地估计电机功率损耗的过程的建模和定义仍然是一个挑战。本实验中使用的材料是晶粒取向（GO）和非晶粒取向（NGO）电工钢。在本文中，针对两种材料都优化了爱泼斯坦镜架，并基于50 Hz给出了数据。在拐角和肢体的功率损耗测量期间，还对泄漏通量进行了研究。

著录项

  • 来源
  • 会议地点 Beijing(CN);Beijing(CN);Beijing(CN)
  • 作者

    I. Daut; K. Anayet; M. Asri; N. Gomesh; Syatirah; et al;

  • 作者单位

    Power Electronics and Electrical Machine Design Research Cluster School of Electrical Systems Engineering Universiti Malaysia Perlis (UniMAP), Malaysia;

    Power Electronics and Electrical Machine Design Research Cluster School of Electrical Systems Engineering Universiti Malaysia Perlis (UniMAP), Malaysia;

    Power Electronics and Electrical Machine Design Research Cluster School of Electrical Systems Engineering Universiti Malaysia Perlis (UniMAP), Malaysia;

    Power Electronics and Electrical Machine Design Research Cluster School of Electrical Systems Engineering Universiti Malaysia Perlis (UniMAP), Malaysia;

    Power Electronics and Electrical Machine Design Research Cluster School of Electrical Systems Engineering Universiti Malaysia Perlis (UniMAP), Malaysia;

    et al;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 计算机仿真;
  • 关键词

    Core losses; Power loss; Leakage Flux; etc;

    机译：核心亏损；电力流失;漏磁通等等;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号