Surface Preparation for Characterizing Microstructure on Transuranic Oxides by Electron Backscatter Spectroscopy and Ion Beam Imaging

机译：电子反散射光谱和离子束成像表征超铀氧化物微观结构的表面制备

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来源
《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》|2012年|708-709|共2页
会议地点 Phoenix, AZ(US)
作者
Pallas Papin; Ching-Fong Chen; Robert Forsyth; Erik Luther; Carl Necker;
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Material Science Division Los Alamos National Laboratory Los Alamos NM 87544;

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入库时间 2022-08-26 14:38:37

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Surface Preparation for Characterizing Microstructure on Transuranic Oxides by Electron Backscatter Spectroscopy and Ion Beam Imaging

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