Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO_3 by Interface-Induced Rotoelectric Coupling Effect

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• 来源
  《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》|2012年|411-412|共2页
• 会议地点 Phoenix, AZ(US)
• 作者

  Y.-M. Kim; A. Hatt; A. Kumar; I. Ivanov; A. Morozovska; A. Tselev; Y.H. Chu; P.Yu; M.D. Biegalski; R. Ramesh; E. Eliseev; S.J. Pennycook; J. Rondinelli; S.V. Kalinin; A.Y. Borisevich;

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• 作者单位

  Oak Ridge National Laboratory Oak Ridge TN;

  Lawrence Berkely National Laboratory Berkeley CA;

  National Academy of Sciences of Ukraine Kiev Ukraine;

  National Chiao Tung University Hsinchu Taiwan University of California-Berkeley Berkeley CA;

  University of California-Berkeley Berkeley CA;

  National Chiao Tung University Hsinchu Taiwan;

  Drexel University Philadelphia PA;

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• 入库时间 2022-08-26 14:38:43