Ultrafast Electron Diffraction and Microscopy: Why We Should Know About Transient Electric Fields and Where They Come From

著录项

• 来源
  《Microscopy and microanalysis.;Microscopy and microanalysis.》|2010年|p.496-497|共2页
• 会议地点 Portland OR(US)
• 作者

  Hyuk Park; Jian-Min Zuo;

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• 作者单位

  Department of Materials Science and Engineering, University of Illinois, Urbana-Champaign, Urbana, IL 61801 USA Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, Urbana, IL 61801 USA;

  Department of Materials Science and Engineering, University of Illinois, Urbana-Champaign, Urbana, IL 61801 USA Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, Urbana, IL 61801 USA;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 显微镜;
• 关键词

• 入库时间 2022-08-26 14:10:07