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Analysis of Writing Inks by Time-of-Flight Secondary Ion Mass Spectrometry – A Forensic Case Study

机译：飞行时间二次离子质谱分析书写墨水–法医案例研究

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《Microscopy and microanalysis.;Microscopy and microanalysis.》||p.390-391|共2页
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A. Schnieders; A. H. Lyter III; N. Havercroft;
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1. Analysis of Ink/Coating Penetration on Paper Surfaces by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) in Conjunction with Principal Component Analysis (PCA) [J] . The Journal of Adhesion . 2008,第3期

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2. Analysis of Ink/Coating Penetration on Paper Surfaces by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) in Conjunction with Principal Component Analysis (PCA) [J] . R. N. S. Sodhi, L. Sun, M. Sain The Journal of Adhesion . 2008,第1a3期

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3. Ballpoint pen inks: characterization by positive and negative ion-electrospray ionization mass spectrometry for the forensic examination of writing inks. [J] . Ng LK, Lafontaine P, Brazeau L Journal of forensic sciences. . 2002,第6期

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5. Surface characterization of polymeric materials by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry: Biomedical materials and forensic applications. [D] . Lyter, Albert H., III. 1999

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8. Nuclear Forensics: Measurements of Uranium Oxides Using Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) [R] . Schuler, W. A. 2010

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