Study of Selected Grain Boundaries in CdTe by Aberration-corrected STEM

著录项

• 来源
  《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》|2012年|423-424|共2页
• 会议地点 Phoenix AZ(US)
• 作者

  Chen Li; Timothy J. Pennycook; Andrew R. Lupini; Donovan N. Leonard; Chad M. Parish; Manuel J. Romero; Helio Moutinho; Mowafak Al-Jassim; Yanfa Yan; Stephen J. Pennycook;

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• 作者单位

  Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TNrn37831 USArnDepartment of Chemistry, Vanderbilt University, Nashville, TN 37235 USA;

  Department of Physics and Astronomy, Vanderbilt University, Nashville, TN 37235 USA Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TNrn37831 USA SuperSTEM Facility, Daresbury, UK.;

  Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TNrn37831 USA;

  Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TNrn37831 USA;

  Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TNrn37831 USA;

  The Measurements and Characterization Group, National Renewable Energy Laboratory, Golden,rnCO 80401 USA;

  The Measurements and Characterization Group, National Renewable Energy Laboratory, Golden,rnCO 80401 USA;

  The Measurements and Characterization Group, National Renewable Energy Laboratory, Golden,rnCO 80401 USA;

  Department of Physics and Astronomy, The University of Toledo, Toledo, OH 43606 USA;

  Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TNrn37831 USA;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词