Imaging Uncoated Plant Seeds with In-lens and Secondary Electron Detectors in a High Vacuum Field Emission SEM

著录项

• 来源
  《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》|2011年|248-249|共2页
• 会议地点 Nashville TN(US)
• 作者

  Dawn Cisneros; Kajal Ghoshroy; Soumitra Ghoshroy;

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• 作者单位

  Electron Microscopy Center, and Department of Biological Sciences, University of SouthrnCarolina, Columbia, SC 29208;

  Division of Science, Mathematics and Engineering, University of South Carolina at Sumter,rnSumter, SC 29150;

  rnElectron Microscopy Center, and Department of Biological Sciences, University of SouthrnCarolina, Columbia, SC 29208;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词