Department of Physics, Southern Connecticut State Univ., New Haven, CT 06515;
Department of Physics, Southern Connecticut State Univ., New Haven, CT 06515;
Facility for Electron Microscopy Trinity College, Hartford, CT 06106;
Facility for Electron Microscopy Trinity College, Hartford, CT 06106;
Department of Electrical Engineering, Yale Univ., New Haven, CT 06520;
Department of Electrical Engineering, Yale Univ., New Haven, CT 06520;
机译:用开尔文探针力显微镜观察铁电畴转换对SrBi2Ta2O9薄膜的晶粒依赖性
机译:结合RBS和原子力显微镜测量磁性隧道结中超薄AlO {sub} x薄膜的厚度和厚度均匀性
机译:通过组合RBS和导电原子力显微镜测量超薄ALO {SUB} X膜在磁隧道连接中的厚度和厚度均匀性
机译:薄膜厚度和晶粒结构测定铁电SRBI2TA2O9与横截面原子力学显微镜
机译:有机光伏的结构-性能-性能关系以及利用光导原子力显微镜表征有机薄膜。
机译:氧响应对BiFe0.95Mn0.05O3薄膜的畴动态和局部电学特性的压电响应力显微镜和导电原子力显微镜研究
机译:通过隧道原子力显微镜测量的高k电介质薄膜的晶粒和晶界的电流电压特性