首页> 外文会议>Micro Electro Mechanical Systems (MEMS), 2009 IEEE 22nd International Conference on; Sorrento,Italy >Development of Calibration Standards for the Optical Measurement of In-Plane Displacements of Micromechanical Components
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Development of Calibration Standards for the Optical Measurement of In-Plane Displacements of Micromechanical Components

机译:制定用于微机械组件平面位移光学测量的校准标准

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摘要

The goal of this work is to develop miniaturized reference standards for the optical measurement of inplane displacements serving for the calibration of optical systems used in the production and characterization of MEMS. The proposed devices consist of SOI-based inplane microactuators. The displacements resulting from both mechanical and electrostatic actuations are measured by means of optical techniques such as stroboscopic illumination, laser-deflection method and digital speckle interferometry.
机译:这项工作的目的是为面内位移的光学测量开发小型化的参考标准,用于校准在MEMS生产和表征中使用的光学系统。拟议的设备包括基于SOI的平面微致动器。机械和静电驱动产生的位移是通过光学技术测量的,例如频闪照明,激光偏转方法和数字散斑干涉测量法。

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