Pulsed Operation and Low-energy Consumption Characteristic on HfON RRAM Devices as Electronic Synapse

著录项

• 来源
  《IEEE International Workshop on Future Computing》|2019年|1-3|共3页
• 会议地点 Hangzhou(CN)
• 作者

  Yuechi Ma; Ao Yu; Yaping Zhang; Zehao Wang; Xiangxiang Ding; Yulin Feng; Lifeng Liu;

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• 作者单位

  School of Software Microelectronics Peking University Beijing China 102600;

  Institute of Microelectronics Peking University Beijing China 100871;

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• 会议组织
• 原文格式 PDF
• 正文语种
• 中图分类
• 关键词

  RRAM; energy consumption; physical vapor deposition; electronic synapses; multi-level;

  机译：RRAM;能源消耗;物理气相沉积;电子突触;多层次;