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Error Crrection for Read-hot Data in 3D-TLC NAND Flash by Read-disturb Modeled Artificial Neural Network Coupled LDPC ECC

机译:通过读干扰建模人工神经网络耦合LDPC ECC的3D-TLC NAND闪存中读热数据误差rrection

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Read-disturb Modeled Artificial Neural Network Coupled LDPC ECC (RDNN-LDPC) is proposed to correct errors of read-hot data for 3D-TLC NAND flash. Conventional ANN-LDPC is optimized to correct errors of read-cold data. However, ANN-LDPC does not correct errors of read-hot data. To correct errors of read-hot data, this paper analyzes how input parameter and model change. As a result, measured results of proposed RDNN-LDPC extend acceptable read cycle of 3D-TLC NAND flash by 10-times.
机译:读干扰建模的人工神经网络耦合LDPC ECC(RDNN-LDPC)被提出以校正3D-TLC NAND闪光的读热数据的误差。常规的Ann-LDPC优化以校正读冷数据的错误。但是,Ann-LDPC不正确的读热数据错误。为了纠正读热数据的错误,本文分析了输入参数和模型变化的变化。结果,所提出的RDNN-LDPC的测量结果延长了3D-TLC NAND闪光的可接受读取周期10次。

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