Surface morphological properties of Cd_xZn_((1-x))S thin films deposited by low-cost atmospheric pressure metal organic chemical vapour deposition technique (AP-MOCVD)

摘要

The Cd_xZn_((1-x))S films have been deposited by low cost atmospheric pressure metal organic chemical vapour deposition (AP-MOCVD) technique and the resulting morphological properties were successfully evaluated for solar cell applications. All morphological properties presented here were investigated by Field-Emission Scanning Microscopy (FESEM) and Energy Dispersive X-Ray (EDX) spectroscopy. It has been observed that the film thickness and grain size have been greatly influenced by the molar ratio of cadmium and zinc, deposition temperature and time. The average grain size of Cd_(0.5)Zn_(0.5)S films (98.16 nm thick) was obtained with deposition temperature and time of 440°C and 2.5 minutes, respectively.