首页> 外文会议>Conference on Digital Design and Manufacturing >Uniformity of Kinematic Trajectory with Wafer Driving Initiatively in plane Lapping Process
【24h】

Uniformity of Kinematic Trajectory with Wafer Driving Initiatively in plane Lapping Process

机译:在平面研磨过程中旋转晶圆驾驶的运动轨迹的均匀性

获取原文
获取外文期刊封面目录资料

摘要

This paper analyses the kinetic trajectory of abrasives both in initiative driving mode and passive driving mode, and the uniformity of lapping trajectory of the two opposite drive modes is discussed, respectively. The imperative relation between the kinematic trajectory and the uniformity is researched in this paper, as well as the simulation of the lapping trajectory.
机译:本文分析了主动驾驶模式和被动驱动模式的研磨剂的动力学轨迹,并分别讨论了两个相对驱动模式的研磨轨迹的均匀性。在本文中研究了运动轨迹与均匀性之间的命令关系,以及研磨轨迹的模拟。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号