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A structural perception about intrinsic point defects in nonstoichiometric compound semiconductors - (PPT)

机译:关于非核算复合半导体中的内在点缺陷的结构性感知 - (PPT)

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Off-stoichiometric CZTS/CZTSe can be Cu-poor/Zn-rich ... Cu-rich/Zn-rich ... Cu-poor/Zn-poor ... Cu-rich/Zn-rich V_(Cu) + Zn_(Cu) Zn_(Sn)+2Cu_i Sn_(Zn) + 2Cu_(Zn) Sn_(Zn)+ 2V_(Cu) Zn_(Sn) + 2Zn_(Cu) Cu_(Sn) + Cu_i + Zn_i Cu_(Zn) + Cu_i Sn_(Cu) + V_(Cu) + V_(Zn) in coexistence with detrimental secondary phases (e. g. ZnS or ZnSe). demonstrated the ability of the CZTS/CZTSe phase to tolerate large deviations from stoichiometric composition without collaps of the kesterite structure It is possible to predict the occuring point defects from the cation ratios Cu/(Zn+Sn) and Zn/Sn of the kesterite phase Growth of homogeneous Cu-poor/Zn-rich CZTS/CZTSe thin films (insted a mixture of different off-stoichiometric kesterite phases) is a challenge but one key to higher efficiencies!
机译:离心计量CZTS / CZTSE可以是Cu-Port / Zn-Rich ... Cu-Rich / Zn-Ford ... Cu-Poil / Zn-Poor ... Cu - 富含/富含锌V_(Cu)+ zn_(cu)zn_(sn)+ 2cu_i sn_(zn)+ 2cu_(zn)sn_(zn)+ 2v_(cu)zn_(sn)+ 2zn_(cu)cu_(sn)+ cu_i + zn_i cu_(zn)+ CU_I SN_(CU)+ V_(CU)+ V_(Zn)与有害的二阶段(例如ZnS或ZnSE)共存。证明了CZT / CZTSE相能够容忍来自化学计量组成的大偏差而没有凯特矿石结构的折扣,可以预测来自酮晶阶段的阳离子率Cu /(Zn + Sn)和Zn / Sn的发生点缺陷均匀Cu-Pois /富含CZTS / CZTSE薄膜的生长(确定不同的离化学计量酮阶段的混合物)是一个挑战,但效率更高的一个关键!

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