Intrinsic Light Yield and Light Loss Coefficient of LuAG: Pr under Excitation with α- and γ- Rays

摘要

In this paper we present the scintillation properties of polished Lu_3Al_5O_(12): Pr(LuAG: Pr) crystals grown by the Czochralski method. The light yield (LY) and energy resolution were measured using XP5200B photomultiplier under excitation with α - and γ- rays. High LY of 20,800 and 5,700 ph/MeV were obtained at 662 keV γ-rays and 5.5 MeV α-rays, respectively, for a 2 mm thick sample. Light yield dependences on sample thickness were measured under excitation with a -and γ- rays and the intrinsic LY and light loss coefficient were evaluated. The LY ratio under excitation with α - and γ- rays (α/γy ratio) was also determined.