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Electrodeposition of Group-IIIA Doped ZnO as a Transparent Conductive Oxide

机译:IIIa的电沉积掺杂ZnO作为透明导电氧化物

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Electrodeposition of Group-IIIA (Al and Ga) doped ZnO with resistivity as low as 3.8×10~(-4) Ω-cm is reported here. This ZnO can be used as an "on-top" transparent conductive oxide which is deposited on semiconductors in thin-film solar cells such as amorphous Si, CIGS, and organic cells. In addition to low cost, high throughput, and large-area processing, electrodeposition provides advantages other solution-based deposition techniques do not offer, including precise and in-line control of the film thickness. After post-deposition annealing, Al-doped ZnO achieves a resistivity of 8×10~(-4) Ω-cm and Ga-doped ZnO 3.8×10~(-4) Ω-cm, respectively. The doping mechanism is believed to be co-precipitation of ZnO with Al_2O_3 or Ga_2O_3 in the aqueous solution, leading to Al or Ga substitution of Zn in the ZnO lattice as n-type dopant. Both Al-doped and Ga-doped ZnO shows high transmittance above 80% for films of-450 nm thick.
机译:据报道,IIIa-IIIa(Al和Ga)掺杂ZnO的电沉积低至3.8×10〜(-4)Ω-cm。该ZnO可用作“顶部”透明导电氧化物,其沉积在薄膜太阳能电池的半导体上,例如无定形Si,CIGS和有机细胞。除了低成本,高通量和大面积加工外,电沉积提供了其他基于溶液的沉积技术,包括不提供的基于溶液的沉积技术,包括对膜厚度的精确和在线控制。在沉积后退火后,Al-掺杂的ZnO可以分别实现8×10〜(-4)Ω-cm和Ga-掺杂ZnO 3.8×10〜(-4)Ω-cm的电阻率。掺杂机构被认为是水溶液中的ZnO与Al_2O_3或Ga_2O_3的共析出,导致ZnO晶格中的Al或Ga取代Zn作为n型掺杂剂。 Al掺杂和Ga-掺杂的ZnO均显示出450nm厚的薄膜的高80%以上的高透射率。

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