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Benchmark Circuit Complexity Validation using Binary Decision Diagram Characteristics

机译:基准电路复杂性验证使用二进制决策图特征

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It has been shown that when Binary Decision Diagrams (BDDs) are formed from uniformly distributed random Boolean Functions (BFs), the average number of nodes in the BDDs is in a simple relation to the number of variables and terms in the BFs. In the present work, the node counts for BBDs formed from ISCAS benchmark circuits are examined and compared to the results for random BFs. The model for random BFs is shown to have strong descriptive power for the benchmark data. Therefore, the model is promoted as a method of predicting, for a given BF, circuit complexity measures such as the area of a VLSI implementation.
机译:已经表明,当由均匀分布的随机布尔函数(BFS)形成二进制判定图(BDD)时,BDD中的平均节点数量是与BFS中的变量数和术语的简单关系。在本作工作中,检查由ISCAS基准电路形成的BBD的节点计数,并与随机BFS的结果进行比较。随机BFS模型被示出为基准数据具有很强的描述性功率。因此,对于给定的BF,电路复杂度措施(例如VLSI实现的区域),该模型被推广为预测的方法。

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