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Sub-picosecond exciton spin-relaxation in GaN

机译:甘氏磷第二次兴奋剂在甘甘中旋转放松

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Exciton spin relaxations in bulk GaN were directly observed with sub-picosecond's time resolution. The obtained spin relaxation times of A-band free exciton are 0.47 ps - 0.25 ps at 150 K - 225 K. The spin relaxation time of the acceptor bound exciton at 15K is measured to be 1.1 ps. These are at least one order of magnitude shorter than those of the other III-V compound semiconductors. The spin relaxation time of A-band free exciton is found to be proportional to T -1.4, where T is the temperature. The fact that the spin relaxation time in GaN is shorter than that in GaAs, in spite of the small spin-orbit splitting, suggests that the spin relaxation is dominated by the defect-assisted Elliot-Yafet process.
机译:散装甘棉中的激子旋转放松与亚皮秒的时间分辨率直接观察到。 A带自由激子的获得的旋转弛豫时间为150k - 225k的0.47 ps - 0.25ps。测量受体结合的激子的旋转弛豫时间为1.1 ps。这些比其他III-V复合半导体的至少一个数量级。发现A场自由激子的旋转松弛时间与T -1.4成比例,其中T是温度。尽管旋转轨道分裂小于GaN中的旋转松弛时间,但旋转松弛时间短于GaAs中的事实,表明旋转松弛是由缺陷辅助的艾略特 - Yafet过程主导。

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